Model 8425 DC Hall System with Cryogenic Probe Station

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Model 8425 DC Hall System with Cryogenic Probe Station

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Model 8425 DC Hall System with Cryogenic Probe Station

A complete Hall effect measurement system using device probing under vacuum in a probe station
Supports a range of DC field Hall measurements—measure mobility on wafer-scale materials and structures as a function of temperature and field
DC fields to 2 T and resistances from 0.5 mΩ to 100 GΩ

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Model 8425 DC Hall System with Cryogenic Probe Station

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Ofrim Group – International

Model 8425 DC Hall System with Cryogenic Probe Station