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Parameter Analyzer

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    Keithley Instruments, USA

  • 4200-SCS Semiconductor Characterization System

    • Total system solution for electrical characterization of devices, materials and semiconductor processes
    • Up to nine precision DC Source-Measure units can supply voltage or current and measure voltage or current from 0.1fA to 1A and from 1μV to 210V.
    • Low noise, wide measurement range, high resolution
    • Fast, single-click test sequencing
    More details
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