It's great Pleasure for All of us here at InterNET to announce the Launch of our new Website!
Open
X
Distribution and Engineering for Test and Measurement & Data Acquisition Systems, Scientific Apparatus and Test Systems, Industrial Informatics, Didactic Equipment and Laboratories, Automated Payment Systems
Warning: Use of undefined constant term_id - assumed 'term_id' (this will throw an Error in a future version of PHP) in /home/forge/www.inter-net.ro/public/wp-content/themes/ofrim/archive.php on line 176
Warning: Use of undefined constant name - assumed 'name' (this will throw an Error in a future version of PHP) in /home/forge/www.inter-net.ro/public/wp-content/themes/ofrim/archive.php on line 176
Model 2520 Pulsed Laser Diode Test System
Simplifies laser diode LIV testing prior to packaging or active temperature control
Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
Sweep can be programmed to stop on optical power limit