Informații produs

4200-SCS Semiconductor Characterization System

  • Total system solution for electrical characterization of devices, materials and semiconductor processes
  • Up to nine precision DC Source-Measure units can supply voltage or current and measure voltage or current from 0.1fA to 1A and from 1μV to 210V.
  • Low noise, wide measurement range, high resolution
  • Fast, single-click test sequencing
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