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Characterization And Parametric Test software

    Listă producători

    Keithley Instruments, USA
  • ACS Basic Edition for Component Characterization

    • Highly configurable, instrument-based system,ideal for SMU-per-pin wafer level reliability (WLR) testing, high speed parallel test, die sorting and binning, NBTI, process control monitoring (PCM)
    • Flexible solution to meet emerging and mature testing needs
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  • The Keithley Interactive Test Environment (KITE)

    • The Keithley Interactive Test Environment (KITE) is the Model 4200-SCS Windows device
      characterization application
    • It provides advanced test definition, parameter analysis and graphing,and automation capabilities required for modern semiconductor characterization
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  • Automated Characterization Suite (ACS) Software

    • Intuitive GUI simplifies test plan development,test execution, and results analysis
    • Develop and execute tests at the device, site, wafer, and cassette level
    • Supports a wide range of instruments and system configurations including multi-SMU parallel
      test systems
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