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Parametric And Integrated Test Systems

    Listă producători

    Keithley Instruments, USA
  • S500 Integrated Test System

    • Highly configurable, instrument-based system
    • Ideal for SMU-per-pin wafer level reliability (WLR) testing, high speed parallel test, die sorting and binning, NBTI, process control monitoring (PCM)
    • Flexible solution to meet emerging and mature testing needs
    Mai multe detalii
  • S530 Parametric Test Systems

    • Readily adaptable to new devices and test requirements
    • Fast, flexible, interactive test plan development
    • Compatible with popular fully automatic probe stations
    • Options for 1kV, C-V, pulse generation,frequency measurements, and low-voltage measurements
    Mai multe detalii
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